Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...

In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...

Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ...

It's no longer enough for test engineers to insert DFT scan chains into a flattened chip layout after synthesis. Now, embedded test structures are being thought of as the first line of defense for ...