AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

In recent years, the development of quantum computers beyond the capability of classical computers has become a new frontier in science and technology and a key direction to realize quantum supremacy.

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Maximized throughput is mandatory for film and sheet extruders, but greater speeds can mean greater opportunities for defects, necessitating inline inspection and thickness measurement. Many ...

A new way to do full-wafer, in-line monitoring to identify missing vias in the back end of line. A viable in-line monitor for missing vias in the back end of line (BEOL) has traditionally been ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...