This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...

The novel technique is based on the VarifocalNet deep-learning object detection framework, which was reportedly tweaked to achieve quicker and more accurate results. Compared to other such methods, ...

Please provide your email address to receive an email when new articles are posted on . Artificial intelligence effectively detected atrial septal defect on ECGs from three separate institutions.

A new technical paper titled “Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS” was published by researchers at KU Leuven, imec, Ghent University, and ...

One of the biggest challenges for non-AI experts is the terminology. Artificial intelligence, machine learning (ML), and computer vision (CV) are frequently discussed, but people outside of data ...